IC TEST EQUIPMENT
SIGMA is providing several kinds of IC TEST Manupulator and Handler for
IC TESTER related equipment.
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IC TEST Manipulator
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●Feature
・SIGMA is exclusively supplying Manipulator for 93000 series to Agilent
Technology which has the largest market share with IC testing equipment
in the world.
・Our accumulated sales record is about 200 units for 16 models of TESTING
equipment for several makers including Agilent as of today.
・We have abundant experience from the low-end model with 2-axis to the
high-end model with 6-axis.
・We correspond to the special use / new subject for wafer level CSP etc.
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| IC TEST Handler V4 |
●Feature
・This handler is high throughput and change kit less model.
・Highly accurate contact
XY±40μm,θ=±0.2°
・High throughput
Four site simultaneous measurement, high speed index
・Less need of change kit
Less need of pocket for alignment
・Occurrence of jaming reduced sharply
Less stress applied to devices
●Specifications
・Applicable devices：BGA, CSP, WLCSP,QFN, LCC (QFP)
・Applicable package size：□1.5〜□20.mm
・Tray size：JEDEC
・Index time：0.5sec at shortest
・Throughput：max. 5000 UPH
・Dimensions：W1640 x D1970 x H1745mm (exclusing tower light)
・Weight: 1,400kgs
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IC TEST Handler H1
●Feature
・This handler is the first change kit less model in the industry.
・High accuracy (+/-25μm) with vision processing
・Reduced device damaging rate and Low jamming rate due to only one time
contact.
・Sharp reduction in change kit cost.
・Shorter settin gchange time
・Versatile infeed, outfeed method
・Optical function of presure force control
・Multi-classification
●Specifications
・Applicable devices：BGA, CSP, QFN, LCC and QFP, SOP
・Applicable package size：□2.5〜□20.mm
・Tray size：W120〜150 ｘ L280〜335 ｘ H4〜8mm
・Index time：0.5sec at shortest
・Throughput：max. 3600 UPH
・Dimensions：W1650 x D1530 x H1800mm (exclusing tower light)
・Weight: 1,900kgs |
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SIGMA Co., Ltd.
5-5-13, Akitsu-cho, Higashimurayama-shi, Tokyo 189-0001 Japan
TEL: +81-42-392-8600 FAX: +81-42-392-5341 E-mail:
question@sigma-fa.co.jp
All reserved 2003C.Σcompany.
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